Title:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author:
Shen, Ruijing. author.
ISBN:
9781461407881
Physical Description:
XXXI, 305p. 104 illus. online resource.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4614-0788-1Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 173778-2001 | ONLINE | Searching... | Searching... |