Skip to:Content
|
Bottom
Cover image for Semiconductor process reliability in practice
Title:
Semiconductor process reliability in practice
Author:
Gan, Zhenghao.
ISBN:
9780071754286
Publication Information:
New York : McGraw Hill Professional, [2012]
Physical Description:
1 electronic text (xv, 605 p. : ill.) : PDF file.
Series:
McGraw Hill ebook library. Engineering and computing, Electrical and electronics
Series Title:
McGraw Hill ebook library. Engineering and computing, Electrical and electronics
Electronic Access:
Subscription required
Holds:
Copies:

Available:*

Library
Material Type
Item Barcode
Shelf Number
Status
Item Holds
Searching...
E-Book 293479-1001 ONLINE
Searching...

On Order

Go to:Top of Page