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1. 
Cover image for Interpretation of electron diffraction patterns
Interpretation of electron diffraction patterns
Author 
Andrews, Kenneth William. Dyson, David John, ort. yaz. Keown, Samuel Robert, ort. yaz.
Preferred Shelf Number 
QD 921 A66 1971
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Interpretation of x-ray powder diffraction patterns
Interpretation of x-ray powder diffraction patterns
Author 
Lipson, Henry Solomon, 1910- Steeple, H.
Preferred Shelf Number 
QD 945 L52 1970
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Beytepe Library~1
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3. 
Cover image for Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filters
Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filters
Author 
Hazra, Lakshminarayan. author. Mukherjee, Pubali. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-2809-0
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4. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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5. 
Cover image for Computational modelling of objects represented in images fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012
Computational modelling of objects represented in images fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012
Author 
CompIMAGE 2012 (2012 : Rome, Italy) Di Giamberardino, Paolo.
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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6. 
Cover image for Interferogram analysis for optical testing
Interferogram analysis for optical testing
Author 
Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-
Preferred Shelf Number 
ONLINE
Electronic Access 
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