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1. 
Cover image for Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filters
Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filters
Author 
Hazra, Lakshminarayan. author. Mukherjee, Pubali. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-2809-0
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2. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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3. 
Cover image for Computational modelling of objects represented in images : fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012
Computational modelling of objects represented in images : fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012
Author 
CompIMAGE 2012 (2012 : Rome, Italy) Di Giamberardino, Paolo.
Preferred Shelf Number 
TA1637 .C66 2012
Electronic Access 
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4. 
Cover image for Numerical modeling of coupled phenomena in science and engineering : practical uses and examples
Numerical modeling of coupled phenomena in science and engineering : practical uses and examples
Author 
Arriaga, M. C. Suarez. Bundschuh, J. Dominguez-Mota, F. J.
Preferred Shelf Number 
QA401 .N86 2009
Electronic Access 
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5. 
Cover image for Interferogram analysis for optical testing
Interferogram analysis for optical testing
Author 
Malacara, Daniel, 1937- author. Malacara, Zacarias, 1948- Servin, Manuel.
Preferred Shelf Number 
QC367 .M25 2005
Electronic Access 
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6. 
Cover image for Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects
Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects
Author 
Morniroli, Jean Paul, author.
Preferred Shelf Number 
QC721 .M8625 2004 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367806361
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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