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1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
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Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23412-5
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3. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0470855606
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Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
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ONLINE(318819.1)
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534
MyiLibrary http://www.myilibrary.com?id=26972
John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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5. 
Cover image for Speckle metrology
Speckle metrology
Author 
Erf, Robert K.
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ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
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6. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
Author 
Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
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ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992
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7. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
Author 
Horn, Alexander, PD Dr.
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ONLINE
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071
John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
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8. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
Author 
Harding, Kevin G.
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Distributed by publisher. Purchase or institutional license may be required for access.
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9. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
Author 
Wong, Terence K. S.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
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10. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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ONLINE
Electronic Access 
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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11. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
Author 
Le Menn, Marc.
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ebrary An electronic book accessible through the World Wide Web; click to view
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John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971
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12. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4471-2167-1
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