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Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
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ONLINE
Electronic Access 
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2. 
Cover image for Accelerator x-ray sources
Accelerator x-ray sources
Author 
Talman, Richard, 1934-
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482329
John Wiley http://dx.doi.org/10.1002/9783527610303
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