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1. 
Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Author 
Yichuang Sun, ed.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS019E
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2. 
Cover image for RF measurements for cellular phones and wireless data systems
RF measurements for cellular phones and wireless data systems
Author 
Scott, Allan W. Frobenius, Rex.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014
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3. 
Cover image for System-on-chip test architectures nanometer design for testability
System-on-chip test architectures nanometer design for testability
Author 
Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735
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