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1. 
Cover image for Materials science in microelectronics
Materials science in microelectronics
Author 
Machlin, E. S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080446394
ScienceDirect http://www.sciencedirect.com/science/book/9780080446400
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2. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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3. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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4. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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5. 
Cover image for Design of cost-efficient interconnect processing units : Spidergon STNoC
Design of cost-efficient interconnect processing units : Spidergon STNoC
Author 
Coppola, Marcello.
Preferred Shelf Number 
TK5105.546 .D47 2009
Electronic Access 
Click here to view.
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6. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
TK7871 .D44 2009
Electronic Access 
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7. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
Electronic Access 
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