Title:
Reliability wearout mechanisms in advanced CMOS technologies
Author:
Strong, Alvin Wayne, 1946-
ISBN:
9780470455265
9780470455258
Publication Information:
Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley, c2009.
Physical Description:
1 online resource (xv, 624 p.) : ill.
Series:
IEEE Press series on microelectronic systems
IEEE Press series on microelectronic systems.
Genre:
Added Author:
Electronic Access:
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 249574-1001 | ONLINE | Searching... | Searching... |