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Publication Date: 2012

Author

SpringerLink (Online service)

(2)

Berglund, Birgitta.

(1)

Gupta, S. V. author.

(1)

Hocken, Robert J.

(1)

Kes, P. H. (Peter H.)

(1)

(1)

Osten, Wolfgang.

(1)

(1)

Pereira, Paulo H.

(1)

Quinten, Michael.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Rogalla, H. (Horst)

(1)

Schaeffer, Ronald D.

(1)

Wong, Terence K. S.

(1)

Language

(11)

Subject

Electronic books.

(2)

(2)

Surfaces (Physics).

(2)

Compound semiconductors -- Design and construction -- Materials.

(1)

Compound semiconductors.

(1)

Coordinate measuring machines.

(1)

Dimensional analysis.

(1)

(1)

Gamma ray detectors -- Materials.

(1)

Human information processing -- Mathematical models.

(1)

Lasers -- Industrial applications.

(1)

Mechanics, applied.

(1)

(1)

Nanotechnology.

(1)

Oceanographic instruments.

(1)

Oceanography -- Measurement.

(1)

Optical measurements.

(1)

Perception -- Mathematical models.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Senses and sensation -- Mathematical models.

(1)

Silicon-on-insulator technology.

(1)

Superconductors -- Industrial applications.

(1)

Superconductors -- Research -- History.

(1)

Thin films -- Optical properties.

(1)

X-ray diffractometer -- Materials.

(1)

X-rays -- Measurement -- Materials.

(1)

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1.

Cover image for Mass Metrology

Author

Gupta, S. V. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-642-23412-5

Format:

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2.

Cover image for Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

Author

Wong, Terence K. S.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610

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3.

Cover image for Optical imaging and metrology advanced technologies

Optical imaging and metrology advanced technologies

Optical imaging and metrology advanced technologies

Author

Osten, Wolfgang. Reingand, Nadya.

Preferred Shelf Number

ONLINE

Electronic Access

Connect to MyiLibrary resource.
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536

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4.

Cover image for Instrumentation and metrology in oceanography

Instrumentation and metrology in oceanography

Instrumentation and metrology in oceanography

Author

Le Menn, Marc.

Preferred Shelf Number

ONLINE

Electronic Access

ebrary An electronic book accessible through the World Wide Web; click to view
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971

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5.

Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

Author

Raza, Hassan. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-642-22984-8

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6.

Cover image for A practical guide to optical metrology for thin films

A practical guide to optical metrology for thin films

A practical guide to optical metrology for thin films

Author

Quinten, Michael.

Preferred Shelf Number

ONLINE

Electronic Access

Check for Full Text Access restricted: MSVU users only
Ebook Library Click here to view book
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9783527664344

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7.

Cover image for Fundamentals of laser micromachining

Fundamentals of laser micromachining

Fundamentals of laser micromachining

Author

Schaeffer, Ronald D.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Availability

Online Library~1

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8.

Cover image for Coordinate measuring machines and systems

Coordinate measuring machines and systems

Coordinate measuring machines and systems

Author

Hocken, Robert J. Pereira, Paulo H.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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9.

Cover image for Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Author

Berglund, Birgitta.

Preferred Shelf Number

ONLINE

Electronic Access

Click here to view

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10.

Cover image for 100 years of superconductivity

100 years of superconductivity

100 years of superconductivity

Author

Rogalla, H. (Horst) Kes, P. H. (Peter H.)

Preferred Shelf Number

ONLINE

Electronic Access

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11.

Cover image for Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Author

Owens, Alan.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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1

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