Limit Search Results
Author
SpringerLink (Online service)
(10)
Wouterlood, Floris G.
(2)
Amit, Michal. editor.
(1)
Bard, Allen J.
(1)
Baró, Arturo M.
(1)
Language
Subject
Microscopy.
(8)
Nanotechnology.
(6)
Atomic force microscopy.
(4)
Life sciences.
(4)
Nanostructured materials.
(3)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
39 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Scanning electrochemical microscopy
Scanning electrochemical microscopy
Author 
Bard, Allen J. Mirkin, Michael V., 1961-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Atom Probe Microscopy
Atom Probe Microscopy
Author 
Gault, Baptiste. author. Moody, Michael P. author. Cairney, Julie M. author. Ringer, Simon P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-3436-8
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Practical methods in electron microscopy
Practical methods in electron microscopy
Author 
Glauert, Audrey M., ed.
Preferred Shelf Number 
QH 207 P7 1972- V.1
Format: 
Availability 
Health Sciences Library~2
Available:
Copies:
4. 
Cover image for Electron microscopy of cells and tissues
Electron microscopy of cells and tissues
Author 
Sjstrand, Fritiof Stig, 1912-
Preferred Shelf Number 
QH 212.E4 S55 1967 1.K
Format: 
Availability 
Health Sciences Library~1
Available:
Copies:
5. 
Cover image for Modeling Nanoscale Imaging in Electron Microscopy
Modeling Nanoscale Imaging in Electron Microscopy
Author 
Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-2191-7
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Reflectance Confocal Microscopy for Skin Diseases
Reflectance Confocal Microscopy for Skin Diseases
Author 
Hofmann-Wellenhof, Rainer. editor. Pellacani, Giovanni. editor. Malvehy, Joseph. editor. Soyer, Hans Peter. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-21997-9
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Molecular manipulation with atomic force microscopy
Molecular manipulation with atomic force microscopy
Author 
Duwez, Anne-Sophie. Willet, Nicolas.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Scanning Electron Microscopy for the Life Sciences
Scanning Electron Microscopy for the Life Sciences
Author 
Schatten, Heide.
Preferred Shelf Number 
ONLINE
Electronic Access 
Access by subscription
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Biomedical research applications of scanning electron microscopy
Biomedical research applications of scanning electron microscopy
Author 
Hodges, Gisele M. ed. Hallowes, Richard C. ed.
Preferred Shelf Number 
QH 212.S3 B615 1979 V.1 1.K
Format: 
Availability 
Health Sciences Library~3
Available:
Copies:
10. 
Cover image for Atomic force microscopy in liquid biological applications
Atomic force microscopy in liquid biological applications
Author 
Baró, Arturo M. Reifenberger, Ronald G.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527649808
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments
Author 
Xie, Hui. author. Onal, Cagdas. author. Régnier, Stéphane. author. Sitti, Metin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-20329-9
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Author 
Sadewasser, Sascha. editor. Glatzel, Thilo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-22566-6
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets