Title:
Analog IC Reliability in Nanometer CMOS
Author:
Maricau, Elie. author.
ISBN:
9781461461630
Physical Description:
XVI, 198 p. 95 illus., 27 illus. in color. online resource.
Series:
Analog Circuits and Signal Processing
Added Author:
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4614-6163-0Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 331961-1001 | ONLINE(331961.1) | Searching... | Searching... |