Title:
Trace-Based Post-Silicon Validation for VLSI Circuits
Author:
Liu, Xiao. author.
ISBN:
9783319005331
Edition:
1st ed. 2014.
Physical Description:
XV, 108 p. 59 illus., 38 illus. in color. online resource.
Series:
Lecture Notes in Electrical Engineering, 252
Added Author:
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-3-319-00533-1Copies:
Available:*
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