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Cover image for Machine Learning, Optimization, and Big Data First International Workshop, MOD 2015, Taormina, Sicily, Italy, July 21-23, 2015, Revised Selected Papers
Title:
Machine Learning, Optimization, and Big Data First International Workshop, MOD 2015, Taormina, Sicily, Italy, July 21-23, 2015, Revised Selected Papers
Author:
Pardalos, Panos. editor.
ISBN:
9783319279268
Edition:
1st ed. 2015.
Physical Description:
XV, 372 p. 115 illus. online resource.
Series:
Information Systems and Applications, incl. Internet/Web, and HCI, 9432
Contents:
Learning with discrete least squares on multivariate polynomial spaces using evaluations at random or low-discrepancy point sets -- Automatic Tuning of Algorithms through Sensitivity Minimization -- Step down and step up statistical procedures for stock selection with Sharp ratio -- Differentiating the multipoint Expected Improvement for optimal batch design -- Dynamic Detection of Transportation Modes using KeypointPrediction -- Effect of the dynamic topology on the performance of PSO-2S algorithm for continuous optimization -- Heuristic for Site-Dependent Truck and Trailer Routing Problem with Soft and Hard Time Windows and Split Deliveries -- Cross-Domain Matrix Factorization for Multiple Implicit-Feedback Domains -- Advanced Metamodeling Techniques Applied to Multidimensional Applications with Piecewise Responses -- Alternating direction method of multipliers for regularized multiclass support vector machines -- Tree-Based Response Surface Analysis -- A Single-Facility Manifold Location Routing Problem with an Application to Supply Chain Management and Robotics -- An Ecient Many-Core Implementation for Semi-Supervised Support Vector Machines -- Intent Recognition in a Simulated Maritime Multi-Agent Domain -- An Adaptive Classification Framework for Unsupervised Model Updating in Nonstationary Environments -- Global Optimization with Sparse and Local Gaussian Process Models -- Condense Mixed Convexity and Optimization with an Application in Data Service Optimization -- SoC-based pattern recognition device for Non Destructive Testing.
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