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Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Author 
Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
Preferred Shelf Number 
ONLINE(357151.1)
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2. 
Cover image for Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Author 
Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(519185.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19941-2
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3. 
Cover image for Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Author 
Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(518392.1)
Electronic Access 
https://doi.org/10.1007/978-1-4471-6741-9
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4. 
Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Author 
Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(519035.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19390-8
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