Title:
Accelerated testing statistical models, test plans and data analyses
Author:
Nelson, Wayne, 1936-
ISBN:
9780470317471
9780470316795
Publication Information:
New York : Wiley, c1990.
Physical Description:
1 online resource (xiv, 601 p.) : ill.
Series:
Wiley series in probability and mathematical statistics. Applied probability and statistics
Series Title:
Wiley series in probability and mathematical statistics. Applied probability and statistics
Electronic Access:
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 295259-1001 | ONLINE | Searching... | Searching... |