Title:
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author:
Kaupp, Gerd. author.
ISBN:
9783540284727
Physical Description:
XII, 292 p. 239 illus. online resource.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-3-540-28472-7Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 181752-2001 | ONLINE | Searching... | Searching... |