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1. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26708-6
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2. 
Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
Author 
Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-27316-2
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3. 
Cover image for Optimal Inspection Models with Their Applications
Optimal Inspection Models with Their Applications
Author 
Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-031-22021-0
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4. 
Cover image for International Conference on Reliable Systems Engineering (ICoRSE) - 2022
International Conference on Reliable Systems Engineering (ICoRSE) - 2022
Author 
Cioboată, Daniela Doina. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-15944-2
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5. 
Cover image for Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Author 
Varde, Prabhakar V. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-19-9334-3
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6. 
Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
Author 
Pham, Hoang. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-21232-1
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7. 
Cover image for Autonomous driving algorithms and Its IC Design
Autonomous driving algorithms and Its IC Design
Author 
Ren, Jianfeng. author. Xia, Dong. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-2897-2
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8. 
Cover image for Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Author 
Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-5049-2
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9. 
Cover image for Handbook of Memristor Networks
Handbook of Memristor Networks
Author 
Chua, Leon. editor. Sirakoulis, Georgios Ch. editor. Adamatzky, Andrew. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-76375-0
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10. 
Cover image for Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
Author 
Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-20813-8
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11. 
Cover image for Low-Power VLSI Circuits and Systems
Low-Power VLSI Circuits and Systems
Author 
Pal, Ajit. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-81-322-1937-8
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12. 
Cover image for Field-Coupled Nanocomputing Paradigms, Progress, and Perspectives
Field-Coupled Nanocomputing Paradigms, Progress, and Perspectives
Author 
Anderson, Neal G. editor. Bhanja, Sanjukta. editor. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-662-43722-3
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