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1. 
Cover image for System-level Test and Validation of Hardware/Software Systems
System-level Test and Validation of Hardware/Software Systems
Author 
Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-145-8
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2. 
Cover image for High Dielectric Constant Materials VLSI MOSFET Applications
High Dielectric Constant Materials VLSI MOSFET Applications
Author 
Huff, H.R. editor. Gilmer, D.C. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137574
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3. 
Cover image for Copper Electrodeposition for Nanofabrication of Electronics Devices
Copper Electrodeposition for Nanofabrication of Electronics Devices
Author 
Kondo, Kazuo. editor. Akolkar, Rohan N. editor. Barkey, Dale P. editor. Yokoi, Masayuki. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-9176-7
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4. 
Cover image for Lattice engineering : technology and applications
Lattice engineering : technology and applications
Author 
Wang, Shumin.
Preferred Shelf Number 
TA403 .L38 2013
Electronic Access 
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