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49. 
Cover image for Recent Trends in Applied Artificial Intelligence 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Amsterdam, The Netherlands, June 17-21, 2013. Proceedings
Recent Trends in Applied Artificial Intelligence 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Amsterdam, The Netherlands, June 17-21, 2013. Proceedings
Author 
Ali, Moonis. editor. Bosse, Tibor. editor. Hindriks, Koen V. editor. Hoogendoorn, Mark. editor. Jonker, Catholijn M. editor.
Preferred Shelf Number 
ONLINE(334627.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-38577-3
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50. 
Cover image for Trends in Applied Knowledge-Based Systems and Data Science 29th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2016, Morioka, Japan, August 2-4, 2016, Proceedings
Trends in Applied Knowledge-Based Systems and Data Science 29th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2016, Morioka, Japan, August 2-4, 2016, Proceedings
Author 
Fujita, Hamido. editor. (orcid)0000-0001-5256-210X Ali, Moonis. editor. Selamat, Ali. editor. Sasaki, Jun. editor. Kurematsu, Masaki. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-42007-3
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51. 
Cover image for Next-Generation Applied Intelligence 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings
Next-Generation Applied Intelligence 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings
Author 
Chien, Been-Chian. editor. Hong, Tzung-Pei. editor. Chen, Shyi-Ming. editor. Ali, Moonis. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-02568-6
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