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1. 
Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow
Digital integrated circuits : design-for-test using Simulink and Stateflow
Author 
Perelroyzen, Evgeni.
Preferred Shelf Number 
TK7874 .P445 2007
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Author 
Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-
Preferred Shelf Number 
TK7874.75 B87 2000
Format: 
Availability 
Beytepe Library~1
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3. 
Cover image for Digital circuit testing a guide to DFT and other techniques
Digital circuit testing a guide to DFT and other techniques
Author 
Wang, Francis C.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127345802
Format: 
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Online Library~1
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4. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
Format: 
Availability 
Online Library~1
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