Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
3 Results Found Subscribe to search results
000DEFAULT
Print
1. 
Cover image for Surface and thin film analysis a compendium of principles, instrumentation, and applications
Surface and thin film analysis a compendium of principles, instrumentation, and applications
Author 
Friedbacher, Gernot. Bubert, H. (Henning) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for An introduction to surface analysis by XPS and AES
An introduction to surface analysis by XPS and AES
Author 
Watts, John F. Wolstenholme, John. John Wiley & Sons. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0470867930
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Surface and thin film analysis principles, instrumentation, applications
Surface and thin film analysis principles, instrumentation, applications
Author 
Bubert, H. (Henning) Jenett, H. (Holger) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/3527600167
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets