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Subject: Electronic apparatus and appliances -- Reliability.

Author

Ohring, Milton, 1936-

(2)

Bâzu, M. I. (Marius I.), 1948-

(1)

Băjenescu, Titu I., 1938-

(1)

Chan, H. Anthony, 1952-

(1)

Connally, Eric.

(1)

Cressler, John D.

(1)

Englert, Paul J, 1960-

(1)

Hnatek, Eugene R.

(1)

Kasprzak, Lucian.

(1)

Mantooth, H. Alan, 1963-

(1)

Pascoe, Norman.

(1)

Suhir, Ephraim.

(1)

Wiley InterScience (Online service)

(1)

Yu, T. X. (Tongxi), 1941-

(1)

Language

(7)

Publication Date

-

(2)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(3)

Environmental testing.

(2)

System failures (Engineering)

(2)

System failures (Engineering) -- Prevention.

(2)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic systems -- Testing.

(1)

Extreme environments.

(1)

Fault tolerance (Engineering)

(1)

Microstructure.

(1)

Optoelectronic devices -- Reliability.

(1)

Structural dynamics.

(1)

Material Type

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Electronic Library

Library

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1.

Cover image for Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

Author

Ohring, Milton, 1936- Kasprzak, Lucian.

Preferred Shelf Number

ONLINE(355485.1)

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780120885749

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Extreme environment electronics

Extreme environment electronics

Extreme environment electronics

Author

Cressler, John D. Mantooth, H. Alan, 1963-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for Reliability technology principles and practice of failure prevention in electronic systems

Reliability technology principles and practice of failure prevention in electronic systems

Reliability technology principles and practice of failure prevention in electronic systems

Author

Pascoe, Norman.

Preferred Shelf Number

ONLINE

Electronic Access

Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9780470980101
http://onlinelibrary.wiley.com/book/10.1002/9780470980101
Books24x7 http://www.books24x7.com/marc.asp?bookid=41740

Format:

Availability

Online Library~1

Available:
Copies:

4.

Cover image for Failure analysis a practical guide for manufacturers of electronic components and systems

Failure analysis a practical guide for manufacturers of electronic components and systems

Failure analysis a practical guide for manufacturers of electronic components and systems

Author

Bâzu, M. I. (Marius I.), 1948- Băjenescu, Titu I., 1938-

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781119990093
Books24x7 http://www.books24x7.com/marc.asp?bookid=41699

Format:

Availability

Online Library~1

Available:
Copies:

5.

Cover image for Structural dynamics of electronic and photonic systems

Structural dynamics of electronic and photonic systems

Structural dynamics of electronic and photonic systems

Author

Suhir, Ephraim. Yu, T. X. (Tongxi), 1941- Connally, Eric. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012

Format:

Availability

Online Library~1

Available:
Copies:

6.

Cover image for Practical reliability of electronic equipment and products

Practical reliability of electronic equipment and products

Practical reliability of electronic equipment and products

Author

Hnatek, Eugene R.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Availability

Online Library~1

Available:
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7.

Cover image for Accelerated stress testing handbook guide for achieving quality products

Accelerated stress testing handbook guide for achieving quality products

Accelerated stress testing handbook guide for achieving quality products

Author

Chan, H. Anthony, 1952- Englert, Paul J, 1960-

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476

Format:

Availability

Online Library~1

Available:
Copies:

8.

Cover image for Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

Author

Ohring, Milton, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780125249850

Format:

Availability

Online Library~1

Available:
Copies:

1

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