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1. 
Cover image for Optical bit error rate an estimation methodology
Optical bit error rate an estimation methodology
Author 
Kartalopoulos, Stamatios V.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060
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2. 
Cover image for Measurement errors in surveys
Measurement errors in surveys
Author 
Biemer, Paul P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0626/2005270829-b.html
ebrary http://site.ebrary.com/id/10509849
http://site.ebrary.com/lib/alltitles/Doc?id=10509849
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3. 
Cover image for Spatial error analysis a unified, application-oriented treatment
Spatial error analysis a unified, application-oriented treatment
Author 
Hsu, David Y., 1945- IEEE Aerospace and Electronic Systems Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273252
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4. 
Cover image for A unified approach to the finite element method and error analysis procedures
A unified approach to the finite element method and error analysis procedures
Author 
Dow, John O., 1941-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122214400
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