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1. 
Cover image for Social-behavioral modeling for complex systems
Social-behavioral modeling for complex systems
Author 
Davis, Paul K., 1943- editor. O'Mahony, Angela, editor. Pfautz, Jonathan, editor.
Preferred Shelf Number 
HA29 .S6736 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119485001
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2. 
Cover image for Emergent behavior in complex systems engineering : a modeling and simulation approach
Emergent behavior in complex systems engineering : a modeling and simulation approach
Author 
Mittal, Saurabh, editor. Diallo, Saikou Y., editor. Tolk, Andreas, editor.
Preferred Shelf Number 
TA168 .E53 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119378952
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3. 
Cover image for Essential Issues in SOC Design Designing Complex Systems-on-Chip
Essential Issues in SOC Design Designing Complex Systems-on-Chip
Author 
Lin, Youn-Long Steve. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-5352-5
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4. 
Cover image for Complexity challenges in cyber physical systems : using modeling and simulation (M & S) to support intelligence, adaptation and autonomy
Complexity challenges in cyber physical systems : using modeling and simulation (M & S) to support intelligence, adaptation and autonomy
Author 
Mittal, Saurabh, author. Tolk, Andreas, author.
Preferred Shelf Number 
TJ213 .M5335 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119552482
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5. 
Cover image for Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
Author 
Arif, Tariq M., author. John Wiley & Sons, publisher.
Preferred Shelf Number 
Q325.73 .A75 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297
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6. 
Cover image for Linear and nonlinear system modeling
Linear and nonlinear system modeling
Author 
Roy, Tamal, editor. Tripathi, Suman Lata, editor. Ganguli, Souvik, editor.
Preferred Shelf Number 
QA402.3 .L56 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119847533
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7. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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8. 
Cover image for Evolving networking technologies : developments and future directions
Evolving networking technologies : developments and future directions
Author 
Gupta, Shaurya, editor.
Preferred Shelf Number 
TK5105.5 .E96 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119836667
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9. 
Cover image for Advanced techniques for maintenance modeling and reliability analysis of repairable systems
Advanced techniques for maintenance modeling and reliability analysis of repairable systems
Author 
Sharma, Garima, author. Rai, Rajiv Nandan, author.
Preferred Shelf Number 
TA169 .S53 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836
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10. 
Cover image for Resilient power electronic systems
Resilient power electronic systems
Author 
Kaboli, Shahriyar, 1975- author. Peyghami, Saeed, author. Blaabjerg, Frede, author.
Preferred Shelf Number 
TK7881.15 .K335 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217
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11. 
Cover image for Introduction to fuzzy logic
Introduction to fuzzy logic
Author 
Peckol, James K., author. John Wiley & Sons, publisher.
Preferred Shelf Number 
QA9.64 .P43 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772644
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12. 
Cover image for System architecture and complexity : contribution of systems of systems to systems thinking
System architecture and complexity : contribution of systems of systems to systems thinking
Author 
Printz, Jacques.
Preferred Shelf Number 
Q295
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119751519
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