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1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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2. 
Cover image for Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013)
Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013)
Author 
Chakravarthi, Veena S. editor. Shirur, Yasha Jyothi M. editor. Prasad, Rekha. editor. SpringerLink (Online service)
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ONLINE(335522.1)
Electronic Access 
http://dx.doi.org/10.1007/978-81-322-1524-0
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3. 
Cover image for VLSI Analog Filters Active RC, OTA-C, and SC
VLSI Analog Filters Active RC, OTA-C, and SC
Author 
Mohan, P.V. Ananda. author. SpringerLink (Online service)
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ONLINE(330555.1)
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-8358-0
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4. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/0-387-46547-2
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