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Subject: Error analysis (Mathematics)

Author

Wiley InterScience (Online service)

(5)

Biemer, Paul P.

(2)

Kartalopoulos, Stamatios V.

(2)

Ainsworth, Mark, 1965-

(1)

(1)

Alwin, Duane F. (Duane Francis), 1944-

(1)

(1)

Berendsen, Herman J. C.

(1)

Bevington, Philip R., 1933-

(1)

Buonaccorsi, John P.

(1)

(1)

Dow, John O., 1941-

(1)

Drosg, Manfred.

(1)

Fuller, Wayne A.

(1)

Gustafson, Paul, 1968-

(1)

(1)

Hlaváček, Ivan, 1933-

(1)

Hsu, David Y., 1945-

(1)

Hughes, Ifan, 1968-

(1)

IEEE Aerospace and Electronic Systems Society.

(1)

Jordache, Cornelius.

(1)

Narasimhan, Shankar.

(1)

Oden, J. Tinsley (John Tinsley), 1936-

(1)

Robinson, D. Keith, ort. yaz.

(1)

Stelzl, Ingeborg.

(1)

Taylor, John Robert, 1939-

(1)

Language

(17)

(1)

Publication Date

-

(5)

(3)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(4)

Finite element method.

(3)

Data transmission systems -- Quality control.

(2)

HATA ANALİZİ (MATEMATİK)

(2)

Optical communications -- Mathematics.

(2)

(2)

Ausreißerwert.

(1)

Automatic data collection systems.

(1)

Bayesian statistical decision theory.

(1)

Bias (Epidemiology)

(1)

Chemical process control -- Automation.

(1)

Data Collection -- methods.

(1)

(1)

EN KÜÇÜK KARELER.

(1)

Electrical engineering -- Mathematics.

(1)

Estimation theory.

(1)

FİZİKİ ÖLÇÜLER.

(1)

Hata Analizi (Matematik)

(1)

Hata analizi (Matematik)

(1)

(1)

MATEMATİKİ FİZİK.

(1)

Mathematical models.

(1)

Mathematical physics.

(1)

Messunsicherheit -- Fehlerrechnung.

(1)

Multivariate analysis.

(1)

Optik iletişim -- Matematik.

(1)

Physical measurements.

(1)

Prozessüberwachung.

(1)

Regression analysis.

(1)

Sampling (Statistics)

(1)

Sequential analysis.

(1)

Social sciences -- Statistical methods.

(1)

Sosyal Bilimler -- İstatistiksel Yöntemler.

(1)

(1)

Structural analysis (Engineering)

(1)

Uncertainty (Information theory)

(1)

Veri iletim sistemleri -- Kalite kontrolü.

(1)

ÇOKDEĞİŞKENLİ ANALİZ.

(1)

Material Type

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Electronic Library

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1.

Cover image for A student's guide to data and error analysis

A student's guide to data and error analysis

A student's guide to data and error analysis

Author

Berendsen, Herman J. C.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=366295

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Measurements and their uncertainties a practical guide to modern error analysis

Measurements and their uncertainties a practical guide to modern error analysis

Measurements and their uncertainties a practical guide to modern error analysis

Author

Hughes, Ifan, 1968- Hase, Thomas.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=330634

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for Latent class analysis of survey error

Latent class analysis of survey error

Latent class analysis of survey error

Author

Biemer, Paul P. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470891155

Format:

Availability

Online Library~1

Available:
Copies:

4.

Cover image for Measurement error models, methods, and applications

Measurement error models, methods, and applications

Measurement error models, methods, and applications

Author

Buonaccorsi, John P.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

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Online Library~1

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5.

Cover image for Dealing with uncertainties a guide to error analysis

Dealing with uncertainties a guide to error analysis

Dealing with uncertainties a guide to error analysis

Author

Drosg, Manfred.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=287984

Format:

Availability

Online Library~1

Available:
Copies:

6.

Cover image for Margins of error a study of reliability in survey measurement

Margins of error a study of reliability in survey measurement

Margins of error a study of reliability in survey measurement

Author

Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html
John Wiley http://dx.doi.org/10.1002/9780470146316

Format:

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Online Library~1

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7.

Cover image for Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Finite element analysis with error estimators an introduction to the FEM and adaptive error analysis for engineering students

Author

Akin, J. E.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750667227

Format:

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Online Library~1

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8.

Cover image for Fehler und Fallen der Statistik : fèur Psychologen, Pèadagogen, Sozialwissenschaftler

Fehler und Fallen der Statistik : fèur Psychologen, Pèadagogen, Sozialwissenschaftler

Fehler und Fallen der Statistik : fèur Psychologen, Pèadagogen, Sozialwissenschaftler

Author

Stelzl, Ingeborg.

Preferred Shelf Number

HA29.5.G4 S73 2005

Format:

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Beytepe Library~1

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9.

Cover image for Uncertain input data problems and the worst scenario method

Uncertain input data problems and the worst scenario method

Uncertain input data problems and the worst scenario method

Author

Hlaváček, Ivan, 1933- Chleboun, Jan. Babuška, Ivo.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444514356

Format:

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Online Library~1

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10.

Cover image for Optical bit error rate an estimation methodology

Optical bit error rate an estimation methodology

Optical bit error rate an estimation methodology

Author

Kartalopoulos, Stamatios V.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060

Format:

Availability

Online Library~1

Available:
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11.

Cover image for Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments

Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments

Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments

Author

Gustafson, Paul, 1968-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Availability

Online Library~1

Available:
Copies:

12.

Cover image for Optical bit error rate : an estimation methodology

Optical bit error rate : an estimation methodology

Optical bit error rate : an estimation methodology

Author

Kartalopoulos, Stamatios V.

Preferred Shelf Number

TK5103.59 K363 2004

Format:

Availability

Beytepe Library~2

Available:
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1 2

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