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1. 
Cover image for Statistical models and methods for lifetime data
Statistical models and methods for lifetime data
Author 
Lawless, Jerald F., 1944-
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html
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2. 
Cover image for Accelerated testing statistical models, test plans and data analyses
Accelerated testing statistical models, test plans and data analyses
Author 
Nelson, Wayne, 1936-
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
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3. 
Cover image for Interval-censored time-to-event data methods and applications
Interval-censored time-to-event data methods and applications
Author 
Chen, Ding-Geng. Sun, Jianguo, 1961- Peace, Karl E., 1941-
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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4. 
Cover image for The statistical analysis of failure time data
The statistical analysis of failure time data
Author 
Kalbfleisch, J. D. Prentice, Ross L.
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118032985
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html
http://swb.eblib.com/patron/FullRecord.aspx?p=708259
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