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1. 
Cover image for Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Author 
Seebauer, Edmund G. author. Kratzer, Meredith C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84882-059-3
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2. 
Cover image for Recent advances in mass transport in materials
Recent advances in mass transport in materials
Author 
Öchsner, Andreas. Murch, G. E.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517157
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3. 
Cover image for Dissimilar Metal Joining
Dissimilar Metal Joining
Author 
Dwivedi, Dheerendra Kumar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-1897-3
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4. 
Cover image for Properties of materials
Properties of materials
Author 
Kelly, P. F., 1961- author.
Preferred Shelf Number 
HD69 .P75 B776 2015
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781482206241
Taylor & Francis https://www.taylorfrancis.com/books/9780429170911
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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