Title:
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author:
Im, Seongil. author.
ISBN:
9789400763920
Physical Description:
XI, 101 p. 61 illus. online resource.
Series:
SpringerBriefs in Physics,
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-94-007-6392-0Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 336233-1001 | ONLINE(336233.1) | Searching... | Searching... |