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Cover image for RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Title:
RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Author:
Gao, Jianjun
ISBN:
9781613530900
Publication Information:
Raleigh, NC : SciTech Publishing Inc., 2010.
Physical Description:
1 online resource ( p.)
Series:
Electromagnetic Waves
Series Title:
Electromagnetic Waves
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