Title:
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author:
Pavlov, Andrei. author.
ISBN:
9781402083631
Physical Description:
online resource.
Series:
Frontiers In Electronic Testing, 40
Series Title:
Frontiers In Electronic Testing, 0929-1296 ; 40
Added Author:
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4020-8363-1Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 170135-2001 | ONLINE | Searching... | Searching... |