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Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-28668-6
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2. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37231-8
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Online Library~1
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