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1. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
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2. 
Cover image for High Mobility and Quantum Well Transistors Design and TCAD Simulation
High Mobility and Quantum Well Transistors Design and TCAD Simulation
Author 
Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336218.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6340-1
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3. 
Cover image for Quantum Physics in the Nanoworld Schrödinger's Cat and the Dwarfs
Quantum Physics in the Nanoworld Schrödinger's Cat and the Dwarfs
Author 
Lüth, Hans. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333411.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31238-0
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4. 
Cover image for Handbook of Nano-Optics and Nanophotonics
Handbook of Nano-Optics and Nanophotonics
Author 
Ohtsu, Motoichi. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333390.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31066-9
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5. 
Cover image for Architecture and Design of Molecule Logic Gates and Atom Circuits Proceedings of the 2nd AtMol European Workshop
Architecture and Design of Molecule Logic Gates and Atom Circuits Proceedings of the 2nd AtMol European Workshop
Author 
Lorente, Nicolas. editor. Joachim, Christian. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333670.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33137-4
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6. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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