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1. 
Cover image for Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniques
Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniques
Author 
Fahrner, W. R. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137771
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2. 
Cover image for Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics
Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-15283-2
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3. 
Cover image for Optical Measurement Techniques Innovations for Industry and the Life Sciences
Optical Measurement Techniques Innovations for Industry and the Life Sciences
Author 
Peiponen, Kai-Erik. editor. Myllylä, Risto. editor. Priezzhev, Alexander V. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71927-4
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4. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
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5. 
Cover image for Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
Author 
Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)
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ONLINE(333782.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33956-1
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6. 
Cover image for Surface Science Techniques
Surface Science Techniques
Author 
Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333819.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-34243-1
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7. 
Cover image for Atomic nanoscale technology in the nuclear industry
Atomic nanoscale technology in the nuclear industry
Author 
Woo, Taeho.
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ONLINE
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8. 
Cover image for Micro- and nanoscale phenomena in tribology
Micro- and nanoscale phenomena in tribology
Author 
Chung, Yip-wah, 1950-
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