Search Results for Metrology

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Metrology

Author

Gao, Wei. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-981-10-4938-5

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Online Library~1

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Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

Author

Raza, Hassan. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-642-22984-8

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Metrology and standardization of nanotechnology : protocols and industrial innovations

Author

Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.

Preferred Shelf Number

ONLINE

Electronic Access

Wiley Online Library

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Fundamental principles of engineering nanometrology

Author

Leach, R. K.

Preferred Shelf Number

ONLINE(355774.1)

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546

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Online Library~1

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Fundamental principles of engineering nanometrology

Author

Leach, R. K.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780080964546

Format:

Availability

Online Library~1

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