Title:
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author:
Sengupta, Anirban. editor.
ISBN:
9789813297678
Edition:
1st ed. 2019.
Physical Description:
XVI, 775 p. 545 illus., 336 illus. in color. online resource.
Series:
Communications in Computer and Information Science, 1066
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-981-32-9767-8Copies:
Available:*
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