
Title:
An introduction to surface analysis by XPS and AES
Author:
Watts, John F., author.
ISBN:
9781119417644
9781119417620
9781119417651
Edition:
Second edition.
Physical Description:
1 online resource : illustrations
Abstract:
"This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum."-- Provided by publisher
"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- Provided by publisher
Local Note:
John Wiley and Sons
Subject Term:
Added Author:
Electronic Access:
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 595347-1001 | TP156 .S95 | Searching... | Searching... |
