Title:
Semiconductor memories technology, testing, and reliability
Author:
Sharma, Ashok K.
ISBN:
9780470546406
Publication Information:
Piscataway, N.J. : IEEE Press ; New York : Institute of Electrical and Electronics Engineers, c1997.
Physical Description:
1 online resource (xii, 462 p.) : ill.
Subject Term:
Genre:
Added Corporate Author:
Electronic Access:
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189Copies:
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Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 249739-1001 | ONLINE | Searching... | Searching... |