Title:
Helium Ion Microscopy Principles and Applications
Author:
Joy, David C. author.
ISBN:
9781461486602
Physical Description:
VIII, 64 p. 29 illus., 16 illus. in color. online resource.
Series:
SpringerBriefs in Materials,
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4614-8660-2Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 332438-1001 | ONLINE(332438.1) | Searching... | Searching... |