Search Results for Scanning probe microscopy.

1.

Acoustic Scanning Probe Microscopy

Author

Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)

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ONLINE(333153.1)

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http://dx.doi.org/10.1007/978-3-642-27494-7

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2.

Roadmap of Scanning Probe Microscopy

Author

Morita, Seizo. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-34315-8

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3.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Author

Bhushan, Bharat. editor. SpringerLink (Online service)

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ONLINE(333137.1)

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http://dx.doi.org/10.1007/978-3-642-25414-7

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4.

Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy

Author

Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-1-4419-7167-8

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5.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Author

Bhushan, Bharat. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-642-10497-8

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6.

Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-85037-3

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7.

Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-74080-3

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8.

Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-37316-2

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9.

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Author

Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-387-28668-6

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10.

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Author

Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/0-387-37231-8

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11.

Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques

Author

Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/b139097

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12.

Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

Author

Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/1-4020-3019-3

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