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1. 
Cover image for Process systems engineering for pharmaceutical manufacturing
Process systems engineering for pharmaceutical manufacturing
Author 
Singh, Ravendra (Research assistant professor), editor. Yuan, Zhihong (Assistant professor of chemical engineering), editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/bookseries/15707946/41
ScienceDirect http://www.sciencedirect.com/science/bookseries/15707946/41
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2. 
Cover image for Quantitative systems pharmacology : models and model-based systems with applications
Quantitative systems pharmacology : models and model-based systems with applications
Author 
Manca, Davide, editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/bookseries/15707946/42
ScienceDirect https://www.sciencedirect.com/science/book/9780444639646
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3. 
Cover image for Integrated Optical Interconnect Architectures for Embedded Systems
Integrated Optical Interconnect Architectures for Embedded Systems
Author 
O'Connor, Ian. editor. Nicolescu, Gabriela. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330817.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6193-8
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4. 
Cover image for Automotive Radar Sensors in Silicon Technologies
Automotive Radar Sensors in Silicon Technologies
Author 
Jain, Vipul. author. Heydari, Payam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330821.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6775-6
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5. 
Cover image for Bio/CMOS Interfaces and Co-Design
Bio/CMOS Interfaces and Co-Design
Author 
Carrara, Sandro. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331564.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4690-3
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6. 
Cover image for Adaptable Embedded Systems
Adaptable Embedded Systems
Author 
Beck, Antonio Carlos Schneider. editor. Lang Lisbôa, Carlos Arthur. editor. Carro, Luigi. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331281.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1746-0
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7. 
Cover image for Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author 
Abu-Rahma, Mohamed H. author. Anis, Mohab. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331282.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1749-1
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