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1. 
Cover image for Sistem ve network mühendisliği
Sistem ve network mühendisliği
Author 
Kırbaş, Kayhan.
Preferred Shelf Number 
QA76.76.O63 K463 2021
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Beytepe Library~1
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2. 
Cover image for System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
Author 
Kochs, Hans-Dieter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-64991-7
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3. 
Cover image for High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Author 
Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-1073-6
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4. 
Cover image for Low-Power Design and Power-Aware Verification
Low-Power Design and Power-Aware Verification
Author 
Khondkar, Progyna. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-66619-8
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5. 
Cover image for The Hardware Trojan War Attacks, Myths, and Defenses
The Hardware Trojan War Attacks, Myths, and Defenses
Author 
Bhunia, Swarup. editor. Tehranipoor, Mark M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-68511-3
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6. 
Cover image for Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Author 
Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-54422-9
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7. 
Cover image for Fault-Tolerant Design
Fault-Tolerant Design
Author 
Dubrova, Elena. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-2113-9
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8. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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9. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8297-1
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10. 
Cover image for VLSI 2010 Annual Symposium Selected papers
VLSI 2010 Annual Symposium Selected papers
Author 
Voros, Nikolaos. editor. Mukherjee, Amar. editor. Sklavos, Nicolas. editor. Masselos, Konstantinos. editor. Huebner, Michael. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-1488-5
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11. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
Author 
Cao, Yu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0445-3
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12. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6993-4
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