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Cover image for Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings
Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings
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Suzuki, Kenji. editor. Higashino, Teruo. editor. Ulrich, Andreas. editor. Hasegawa, Toru. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-68524-1
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Cover image for Testing of Software and Communicating Systems 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings
Testing of Software and Communicating Systems 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings
Author 
Petrenko, Alexandre. editor. Veanes, Margus. editor. Tretmans, Jan. editor. Grieskamp, Wolfgang. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73066-8
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Cover image for Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings
Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings
Author 
Uyar, M. Ümit. editor. Duale, Ali Y. editor. Fecko, Mariusz A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11754008
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4. 
Cover image for Analogue-digital ASICs Circuit techniques, design tools and applications
Analogue-digital ASICs Circuit techniques, design tools and applications
Author 
Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.
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http://dx.doi.org/10.1049/PBCS003E
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