Title:
Thin film analysis by X-ray scattering
Author:
Birkholz, Mario.
ISBN:
9783527310524
9783527607594
Publication Information:
Weinheim : Wiley-VCH, c2006.
Physical Description:
xxii, 356 p. : ill. ; 25 cm.
Added Corporate Author:
Electronic Access:
John Wiley http://dx.doi.org/10.1002/3527607595http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282
Copies:
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