Search Results for Electronic circuits -- Testing.

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SpringerLink (Online service)

(2)

Agrawal, Vishwani D., 1943-

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

Domingo, George, 1937- author.

(1)

Foster, Harry, 1956-

(1)

Franca, J., ed.

(1)

Gizopoulos, Dimitris.

(1)

Huang, Wei, editor.

(1)

Lidow, Alex, author.

(1)

Litovski, Vančo B. author.

(1)

Maloberti, F., ed.

(1)

Mang, Theo. editor.

(1)

Meng, Hong, editor.

(1)

Mohindru, Pooja.

(1)

Perry, Douglas L.

(1)

Russell, Gordon, ed.

(1)

Soin, R. S., ed.

(1)

Taylor, Gaynor, ed.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Whitaker, Jerry C.

(1)

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Subject

Application-specific integrated circuits.

(2)

Digital integrated circuits.

(2)

Electronic circuits -- Testing.

(2)

Electronic circuits--Testing.

(2)

(2)

Linear integrated circuits.

(2)

Logic circuits--Computer-aided design.

(2)

(2)

Analog-to-digital converters.

(1)

(1)

Chemistry, Technical.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

Corrosion and anti-corrosives.

(1)

(1)

(1)

Digital integrated circuits -- Testing.

(1)

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric discharges -- Prevention.

(1)

Electronic Circuits and Systems.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances.

(1)

Electronic books.

(1)

Electronic circuits -- Computer simulation.

(1)

Electronic circuits -- Handbooks, manuals, etc.

(1)

Electronic circuits -- Testing -- Data processing.

(1)

Electronic circuits.

(1)

Electronic packaging.

(1)

Electronics and Microelectronics, Instrumentation.

(1)

(1)

Electrostatics.

(1)

Elektronik devreler -- Test etme.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Industrial Chemistry.

(1)

Industrial and Production Engineering.

(1)

Industrial engineering.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Protection.

(1)

Integrated circuits -- Verification.

(1)

Integrated circuits -- Very large scale integration -- Testing.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Testing.

(1)

Integrated circuits--Very large scale integration.

(1)

(1)

Materials science.

(1)

Mise sous boîtier (Électronique)

(1)

Nitrure de gallium.

(1)

Operational amplifiers.

(1)

Power transistors.

(1)

Production engineering.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Switched capacitor filters.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

TECHNOLOGY & ENGINEERING.

(1)

TECHNOLOGY / Electronics / Circuits / General

(1)

TECHNOLOGY / Electronics / Circuits / Logic

(1)

TECHNOLOGY / Electronics / Microelectronics

(1)

Telecommunication.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

antistatic agent.

(1)

(1)

Électronique de l'état solide.

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

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1.

Cover image for Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits

Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits

Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits

Author

Litovski, Vančo B. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-981-97-8257-4

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

Format:

Availability

Beytepe Library~1

Available:
Copies:

3.

Cover image for GaN power devices for efficient power conversion

GaN power devices for efficient power conversion

GaN power devices for efficient power conversion

Author

Lidow, Alex, author.

Preferred Shelf Number

TK7871.95 .L53 2025

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980

Format:

Availability

Online Library~1

Available:
Copies:

4.

Cover image for Flexible electronic packaging and encapsulation technology

Flexible electronic packaging and encapsulation technology

Flexible electronic packaging and encapsulation technology

Author

Meng, Hong, editor. Huang, Wei, editor.

Preferred Shelf Number

TK7870.15 .F54 2024

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729

Format:

Availability

Online Library~1

Available:
Copies:

5.

Cover image for Practical ESD protection design

Practical ESD protection design

Practical ESD protection design

Author

Wang, Albert Z. H., 1962- author.

Preferred Shelf Number

TK7874

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434

Format:

Availability

Online Library~1

Available:
Copies:

6.

Cover image for Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners.

Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners.

Electronic circuit analysis using LTSpice XVII simulator : a practical guide for beginners.

Author

Mohindru, Pooja.

Preferred Shelf Number

TK7867 .M64 2021

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781003199489
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

7.

Cover image for Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Author

Domingo, George, 1937- author.

Preferred Shelf Number

TK7871.85 .D66 2020

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124

Format:

Availability

Online Library~1

Available:
Copies:

8.

Cover image for Encyclopedia of Lubricants and Lubrication

Encyclopedia of Lubricants and Lubrication

Encyclopedia of Lubricants and Lubrication

Author

Mang, Theo. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-642-22647-2

Format:

Availability

Online Library~1

Available:
Copies:

9.

Cover image for Applied formal verification

Applied formal verification

Applied formal verification

Author

Perry, Douglas L. Foster, Harry, 1956-

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

Format:

Availability

Online Library~1

Available:
Copies:

10.

Cover image for Advances in electronic testing : challenges and methodologies

Advances in electronic testing : challenges and methodologies

Advances in electronic testing : challenges and methodologies

Author

Gizopoulos, Dimitris.

Preferred Shelf Number

TK7867 .A385 2006

Format:

Availability

Beytepe Library~1

Available:
Copies:

11.

Cover image for The electronics handbook

The electronics handbook

The electronics handbook

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7867 .E4244 2005

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

12.

Cover image for Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Algorithmic and Knowledge-based CAD for VLSI

Author

Taylor, Gaynor, ed. Russell, Gordon, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS004E

Format:

Availability

Online Library~1

Available:
Copies:

1 2

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