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1. 
Cover image for Advances in imaging and electron physics.
Advances in imaging and electron physics.
Author 
Hawkes, Peter W., ed.
Preferred Shelf Number 
QC 793.5.E62 A3 V.127 2003
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2. 
Cover image for Alternatif akım devreleri ve problem çözümleri
Alternatif akım devreleri ve problem çözümleri
Author 
Yağımlı, Mustafa. Akar, Feyzi.
Preferred Shelf Number 
TK7816 Y25 2024
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3. 
Cover image for Understanding Error Control Coding
Understanding Error Control Coding
Author 
Sanvicente, Emilio. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-05840-1
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4. 
Cover image for Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Author 
Banerjee, Amal. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-99001-9
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5. 
Cover image for Projected Capacitive Touch A Practical Guide for Engineers
Projected Capacitive Touch A Practical Guide for Engineers
Author 
Gray, Tony. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-98392-9
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6. 
Cover image for Scheduling Parallel Applications on Heterogeneous Distributed Systems
Scheduling Parallel Applications on Heterogeneous Distributed Systems
Author 
Xie, Guoqi. author. Zeng, Gang. author. Li, Renfa. author. Li, Keqin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-6557-7
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7. 
Cover image for Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Author 
Ray, Sandip. author. Basak, Abhishek. author. Bhunia, Swarup. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-93464-8
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8. 
Cover image for Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Author 
Amiri, Iraj Sadegh. author. Mohammadi, Hossein. author. Hosseinghadiry, Mahdiar. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-030-04513-5
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9. 
Cover image for Instruments, Measurement Principles and Communication Technologies for Downhole Drilling Environments
Instruments, Measurement Principles and Communication Technologies for Downhole Drilling Environments
Author 
Gooneratne, Chinthaka P. author. Li, Bodong. author. Deffenbaugh, Max. author. Moellendick, Timothy. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-030-04900-3
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10. 
Cover image for Proceedings of the Third International Conference on Microelectronics, Computing and Communication Systems MCCS 2018
Proceedings of the Third International Conference on Microelectronics, Computing and Communication Systems MCCS 2018
Author 
Nath, Vijay. editor. Mandal, Jyotsna Kumar. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-7091-5
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11. 
Cover image for Engineering Optics
Engineering Optics
Author 
Iizuka, Keigo. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-69251-7
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12. 
Cover image for Semi-physical Verification Technology for Dynamic Performance of Internet of Things System
Semi-physical Verification Technology for Dynamic Performance of Internet of Things System
Author 
Yu, Xiaolei. author. Wang, Donghua. author. Zhao, Zhimin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-1759-0
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