Cover image for Thin film analysis by X-ray scattering
Title:
Thin film analysis by X-ray scattering
Author:
Birkholz, Mario.
ISBN:
9783527310524

9783527607594
Publication Information:
Weinheim : Wiley-VCH, c2006.
Physical Description:
xxii, 356 p. : ill. ; 25 cm.
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