Cover image for Characterization in silicon processing
Title:
Characterization in silicon processing
Author:
Strausser, Yale.
ISBN:
9781606501115

9781606501092
Publication Information:
New York, NY : Momentum Press, 2010.
Physical Description:
1 online resource (xv, 240 p.) : ill.
Series:
Materials characterization series
Series Title:
Materials characterization series
Holds:
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