Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Title:
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author:
Fan, Yongquan. author.
ISBN:
9789048193981
Physical Description:
XII, 250p. 120 illus., 60 illus. in color. online resource.
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E-Book 205484-2001 ONLINE
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